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9th Annual Waseda Global Patent Law Conference

October 30, 2020
SUEYOSHI, Tsuyoshi


Hosted by
Waseda University Institute for Intellectual Property Law, Waseda University Faculty of Law, University of Pennsylvania Law School, University of Pennsylvania Centre for Technology, Innovation and Competition (CTIC), and the FCBA
Practice Areas


The first panel, led by Delaware Federal District Court Chief Judge Stark and Tokyo District Court Presiding Judge Tanaka, will discuss the challenges that litigants and courts face in Japan and the US these days when collecting evidence to secure success in patent disputes. The discussion will include consideration of recent developments in law and practice, the difficulties and opportunities posed by the US discovery process, as well as the introduction of the inspection claim in Japanese patent law this year.

Other seminars by SUEYOSHI, Tsuyoshi

Other seminars on Patents



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